Push the limits for refractive index measurements
Our reflectometers feature most accurate single beam reflectance measurements by height and tilt adjustment of sample and high light conductance of optical layout allow repeatable measurements of n andk, measurements on rough surfaces as well as thickness measurements of very thin films.
UV to NIR spectral range
RM ۱۰۰۰ ۴۳۰ nm – ۹۳۰ nm
RM ۲۰۰۰ ۲۰۰ nm – ۹۳۰ nm
High resolution mapping
The reflectometers RM ۱۰۰۰ and RM ۲۰۰۰ can optionally be equipped with an x‑y mapping stage and mapping software, objective lens for small spot size, and a video camera.
The spectroscopic reflectometers RM ۱۰۰۰ and RM ۲۰۰۰ measure reflectance of flat or curved samples with smooth or rough surface. Thickness, extinction coefficient, and refractive index of single films or layer stacks are calculated using SENTECH FTPadv Expert software. Single films between ۵ nm and ۵۰ µm thickness, layer stacks, and substrates can be analyzed in the UV‑VIS‑NIR spectral range.
The RM ۱۰۰۰ and RM ۲۰۰۰ represent high end SENTECH reflectometers. The table top device comprises the highly stabilized light source, the reflection optics with auto-collimating telescope and microscope, the height and tilt adjustable sample platform, the spectral photometer, and the power supply. It can be optionally equipped with an x‑y mapping stage and mapping software, objective lens for a second spot size, and a video camera.
Besides film thickness and optical constants, the composition of films (e. g. of AlGaN on GaN, SiGe on Si), AR coating (e. g. on textured silicon solar cells, UV sensitive GaN devices), and coatings on small medical stents can be measured by our reflectometers. These reflectometers support applications in microelectronics, microsystems technology, optoelectronics, glass coatings, flat panel technology, life science, biotechnology, and others.
The comprehensive, recipe oriented FTPadv EXPERT software for our reflectometers RM ۱۰۰۰ / ۲۰۰۰ includes measurement set-up, data acquisition, modeling, fitting, and reporting. An extensive database of predefined customer proven and ready to use applications is already built in. The AutoModel option allows for automatic selection of sample model from a spectra library. Based on SENTECH expertise in spectroscopic ellipsometry, a large materials library and the variety of dispersion models allow the analysis of nearly all materials and films by our spectroscopicreflectometers. The data library can easily be updated with new optical data by the operator. SENTECH supports its customers with the measurement of new materials with unknown optical properties by spectroscopic ellipsometry.