میکروسکوپ نیروی اتمی AFM

میکروسکوپ نیروی اتمی AFMReviewed by Mohammadmarashi on May 19Rating:

میکروسکوپ نیروی اتمی AFM

دی ام ای رزولوشن 4687 new_AFM2 میکروسکوپ نانوسکوپ url میکروسکوپ پروبی روبشی 2 میکروسکوپ تونلی روبشی میکروسکوپ نیروی اتمی atomic-force-microscopes-afm-40257-5242211

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Tips and information about scanning with Atomic Force Microscopes

The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes.

Fundamentals

Common fundamentals about AFM microscopy:

A short introduction to Scanning Probe Microscopy

SPM modi and measurement methods

Technical fundamentals:

What makes a scanner stage stable?

What determines the maximum scan speed of AFMs?

Working with AFMs

Our videos show how to work with the different instruments in various applications.

Applications:

There are a variety of applications, so we have gathered some examples of applications.

Sample preparation:

میکروسکوپ نیروی اتمی AFM

میکروسکوپ نیروی اتمی AFM

میکروسکوپ نیروی اتمی AFM

One of the most important, and quite often neglected, aspects of the work with AFM microscopes is the sample surface preparation: Influences on Scanning Probe Microscopy from surface contamination layers.

میکروسکوپ نیروی اتمی AFM

Data processing

میکروسکوپ نیروی اتمی AFM

Comparing AFM images with Scanning Electron Microscope (SEM) images, the AFM images often look dull and without contrast, because AFM images designate the true height information, whereas the lighting in the SEM is selected so that the image will “look good”.

میکروسکوپ نیروی اتمی AFM

Possibilities of image processing

میکروسکوپ نیروی اتمی AFM

Tips and information about scanning with Atomic Force Microscopes

The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes.

میکروسکوپ نیروی اتمی AFM

Fundamentalsمیکروسکوپ نیروی اتمی AFM

Common fundamentals about AFM microscopy:

میکروسکوپ نیروی اتمی AFM

A short introduction to Scanning Probe Microscopy

SPM modi and measurement methods

Technical fundamentals:

What makes a scanner stage stable?

What determines the maximum scan speed of AFMs?

Working with AFMs

Our videos show how to work with the different instruments in various applications.

Applications:

There are a variety of applications, so we have gathered some examples of applications.

Sample preparation:

One of the most important, and quite often neglected, aspects of the work with AFM microscopes is the sample surface preparation: Influences on Scanning Probe Microscopy from surface contamination layers.

Data processing

Comparing AFM images with Scanning Electron Microscope (SEM) images, the AFM images often look dull and without contrast, because AFM images designate the true height information, whereas the lighting in the SEM is selected so that the image will “look good”.

Possibilities of image processing