برچسب: میکروسکوپ الکترون ثانویه

میکروسکوپ نیروی اتمی AFM Tips and information about scanning with Atomic Force Microscopes The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes. Fundamentals Common fundamentals about AFM microscopy: A short introduction to Scanning Probe Microscopy SPM modi and measurement methods Technical fundamentals: What makes a scanner stage stable? What determines the maximum scan speed of AFMs? Working with AFMs Our videos show how to work with the different instruments in various applications. Applications: There are a variety of applications, so we have gathered some examples of applications. Sample preparation: میکروسکوپ نیروی اتمی AFM میکروسکوپ نیروی اتمی AFM میکروسکوپ نیروی اتمی AFM One of the most important, and quite often neglected, aspects of the work with AFM microscopes is the sample surface preparation: Influences on Scanning Probe Microscopy from surface contamination layers. میکروسکوپ نیروی اتمی AFM Data processing میکروسکوپ نیروی اتمی AFM Comparing AFM images with Scanning Electron Microscope (SEM) images, the AFM images often look dull and without contrast, because AFM images designate the true height information, whereas the lighting in the SEM is selected so that the image will "look good". میکروسکوپ نیروی اتمی AFM Possibilities of image processing میکروسکوپ نیروی اتمی AFM Tips and information about scanning with Atomic Force Microscopes The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes. میکروسکوپ نیروی اتمی AFM Fundamentalsمیکروسکوپ نیروی اتمی AFM Common fundamentals about AFM microscopy: میکروسکوپ نیروی اتمی AFM A short introduction to Scanning Probe Microscopy SPM modi and measurement methods Technical fundamentals: What makes a scanner stage stable? What determines the maximum scan speed of AFMs? Working with AFMs Our videos show how to work with the different instruments in various applications. Applications: There are a variety of applications, so we have gathered some examples of applications. Sample preparation: One of the most important, and quite often neglected, aspects of the work with AFM microscopes is the sample surface preparation: Influences on Scanning Probe Microscopy from surface contamination layers. Data processing Comparing AFM images with Scanning Electron Microscope (SEM) images, the AFM images often look dull and without contrast, because AFM images designate the true height information, whereas the lighting in the SEM is selected so that the image will "look good". Possibilities of image processing