برچسب: میکروسکوپ الکترون ثانویه

میکروسکوپ نیروی اتمی AFM Tips and information about scanning with Atomic Force Microscopes The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes....